Your question is Defect Finding Inside Chips. Take a moment with it on the right.
Talk me through your thinking if you like. When you're confident, submit your answer and I'll grade it like a real screen (7/10 or better passes).
How would you find a defect inside chips, and how many chips would you need to find the reference chip when noise is present?
Answer as a search-and-classification problem, not a fabrication process question. Explain the strategy, what noise changes, and the minimum chip count needed for a reliable reference under uncertainty.
