How would you design a computer vision model to detect microscopic anomalies on a Micron Technology silicon wafer when you only have 50 examples of defective wafers and 100,000 examples of normal ones?
Problem
How would you design a computer vision model to detect microscopic anomalies on a Micron Technology silicon wafer when you only have 50 examples of defective wafers and 100,000 examples of normal ones?
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