To succeed, you must demonstrate a deep understanding of semiconductor testing and the specific challenges associated with high-speed, high-bandwidth interconnects. Below are the primary areas where you will be evaluated.
Automated Test Equipment (ATE) & System-Level Testing (SLT)
This is the core of the Test Engineer role. We need to know that you can translate product requirements into robust, high-yield test programs. Interviewers will look for your ability to write, debug, and optimize patterns on standard platforms.
Be ready to go over:
- Platform Experience – Your hands-on work with testers like Advantest, Teradyne, or LTX, including hardware setup and loadboard design considerations.
- Test Optimization – Techniques for reducing test time without compromising test coverage.
- SLT Methodologies – Bridging the gap between structural ATE tests and functional system-level environments.
- Advanced concepts (less common) – Multi-site testing strategies, thermal control during SLT, and handling massive parallel test data.
Example questions or scenarios:
- "Walk me through a time you successfully reduced test time on an ATE platform. What trade-offs did you consider?"
- "How do you ensure correlation between ATE results and SLT performance?"
- "Describe your process for developing a test program for a newly taped-out ASIC."
Failure Analysis & Yield Improvement
At Celestial AI, finding a defect is only the first step; understanding why it happened and how to prevent it is what drives our product forward. You will be evaluated on your systematic approach to root cause analysis.
Be ready to go over:
- Data Analysis – How you use statistical tools and data visualization to identify yield limiters.
- Debug Methodologies – Isolating faults between the device under test (DUT), the test hardware, or the test software.
- Cross-functional Debugging – Collaborating with design and firmware teams to implement corrective actions.
- Advanced concepts (less common) – Silicon characterization across process, voltage, and temperature (PVT) corners.
Example questions or scenarios:
- "You notice a sudden 5% yield drop on a mature production lot. Walk me through your debugging steps."
- "How do you differentiate between a silicon design flaw and a test program error?"
- "Tell me about a time you had to push back on a design team regarding testability requirements."
Communication Protocols & High-Speed Interfaces
Our Photonic Fabric™ interfaces with cutting-edge AI accelerators, meaning you must be fluent in the protocols that govern these interactions.
Be ready to go over:
- Low-Speed Control Protocols – Deep understanding of I2C, SPI, and UART.
- Test Interfaces – Practical application of JTAG (IEEE 1149.1) and boundary scan techniques.
- High-Speed Interfaces – Familiarity with PCIe and the fundamentals of high-speed signal integrity.
- Advanced concepts (less common) – RF testing basics, eye diagram analysis, and jitter tolerance.
Example questions or scenarios:
- "Explain how you would use JTAG boundary scan to verify the connectivity of a complex 2.5D packaged device."
- "What are the common failure modes you look for when testing a PCIe interface?"
- "How do you debug an I2C communication failure on a prototype board?"
Scripting & Test Automation
Manual testing cannot scale. We evaluate your ability to write clean, efficient code to automate data collection, control instruments, and parse complex test logs.
Be ready to go over:
- Python Proficiency – Using Python for instrument control, data parsing (Pandas/NumPy), and automation frameworks.
- C/C++ Skills – Writing low-level test scripts or firmware interactions.
- Data Infrastructure – Automating the pipeline from raw tester data to actionable yield reports.
Example questions or scenarios:
- "Write a Python script to parse a CSV log file and extract devices that failed a specific voltage threshold."
- "How do you manage version control and deployment for your test scripts across multiple ATE setups?"